Materials & Processes
Detect sub-10nm contamination to drive yield
Nanoparticles kill up to 70% of the computer chips in the production. UNISERS is the only solution to detect nanoparticles efficiently and enable yield improvements.
The semiconductor manufacturers are losing computer chips worth billions of USD and tons of rare natural resources due to particle contamination. Particles can originate from over a thousand process steps with different machines, liquids, filters, consumables, gases, and others. These particles deposit on the nanometer scale patterns of the semiconductor chip and destroy its properties. Localizing the contamination source with existing solutions is impossible or can take weeks.
UNISERS is the only solution to detect 10nm particles fast and affordably. The patented nanotechnology enhances the optical signals of particles by at least three orders of magnitudes and enables superior sensitivity at a fraction of competitors‘ costs. Another major advantage is the high precision of the size estimation because other optical technologies suffer severe distortion as the signal strength depends on the particles‘ optical properties. The technology can also be used to get a molecular fingerprint (Raman) of the particles to improve R&D (e.g., optimize filters).
The company is working with the leading industry committee (IRDS) on projects to understand the yield dilemma. High-end suppliers of the semiconductor manufacturers are already relying on the analysis service from the ETH-Spin-Off. Currently, the start-up is preparing for projects at the customer site and achieve the first tool sales.
Ali Ö. Altun is the CEO of UNISERS AG. Before his Ph.D. in nanotechnology, he worked for more than four years in South Korea at projects with the leading semiconductor companies. In the last three years, he presented UNISERS at the major industry events and congresses. He established a strong network with experts from leading semiconductor companies and a deep understanding of the industry's urgent contamination challenges.